Mission Critical Automation Testing

When critical subsystems fail, the resulting losses can be catastrophic. In the insurance industry, if premiums are miscalculated, defect costs can reach well over a million dollars. In this session, Mike Keith and Dom Nunley draw on their practical experience with insurance systems testing to provide an overview of combinatorial automation testing for high-risk backend system areas—i.e., features that absolutely must work correctly. They share a process for categorizing requirement risk levels to determine which requirements warrant combinatorial testing. Mike and Dom illustrate various combinatorial testing techniques such as N-FAT, N-Wise, and RANDOM, which can be used to automatically generate test cases. These methods are used to ensure coverage against risk while controlling the number of tests that run. Attend this session to learn a method for assessing the Return on Investment (ROI) of combinatorial test automation and how this approach can vastly increase test coverage while minimizing the risk of costly business critical failures.